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Field Application Engineer

Leuven, Vlaams-Brabant, BelgiumOn-site

AI Summary

A Field Application Engineer demonstrates and supports Atomic Force Microscopy (AFM) systems at a semiconductor R&D client site in Leuven, translating customer metrology challenges into actionable insights and product development feedback.

About this role

Position Overview

As a Field Application Engineer, you will play a critical role in bridging Nearfield Instruments’ technology, customers, and internal development teams. Based at our client site in Leuven, Belgium, you will support the successful deployment and application of Nearfield’s advanced Atomic Force Microscopy (AFM) solutions within a leading semiconductor R&D environment. You will work closely with customer engineers and researchers to address complex metrology challenges, demonstrate system performance, and translate customer requirements into future product and application developments. As a highly customer-facing technical expert, you will act as a key liaison between our client, R&D, Product Management, Engineering, and Commercial teams, helping ensure that Nearfield’s next-generation metrology solutions continue to meet the evolving needs of the semiconductor industry.

Why This Role Is Important

The semiconductor industry continues to push the limits of device scaling and complexity. As traditional metrology approaches face increasing challenges, advanced AFM-based metrology is becoming essential for enabling accurate process control at the nanoscale. As a Field Application Engineer, you will help drive the adoption and success of Nearfield’s breakthrough metrology technology within one of the world's most advanced semiconductor research environments. Your work will directly contribute to the development of next-generation semiconductor.

Key Responsibilities

Customer Application Support & Technical Engagement

  • Demonstrate the capabilities of our AFM systems on customer wafers and evaluate application performance.

  • Identify and understand customer metrology challenges and process control requirements.

  • Analyse measurement data and translate findings into clear recommendations and actionable insights.

  • Present technical results and showcase the unique value of Nearfield Instruments' solutions to customers.

  • Develop and optimize measurement recipes for advanced semiconductor applications.

  • Lead investigations into measurement and data-processing related issues and coordinate resolution with support, engineering, and development teams.

  • Work with Development & Engineering and R&D teams to create new metrology solutions, measurement modes, algorithms, and data analysis capabilities.

  • Capture customer feedback, technology roadmaps, and future requirements to help shape the next generation of products.

What We Offer

  • A high-impact role in a fast-growing deep-tech company

  • Opportunity to contribute to Nearfield’s growth in a strategic market

  • Strong collaboration with international teams

  • Learning and development in a global commercial environment

  • A dynamic and entrepreneurial working environment

Location

Leuven, Belgium (Onsite)

9:00–17:00

  • Flexible working hours available

  • Overtime may be required

  • Five-day workweek, with weekends and public holidays off

  • Business trip to our HQ in Rotterdam or other clients’ sites are quired

About Nearfield Instruments

Nearfield Instruments (NFI) is a fast‑growing high‑tech scale‑up. We design, develop, integrate, market, and service advanced metrology machines for the semiconductor industry. Our tools enable the world’s leading chipmakers to increase production yield and improve device performance, contributing to the continued scaling of semiconductor technology.

Founded in 2016, Nearfield brings together approximately 430 employees worldwide, combining deep scientific expertise with industrial execution. Our unique, high‑throughput Atomic Force Metrology platform addresses the most advanced metrology challenges in high‑volume semiconductor manufacturing. As our installed base in Japan continues to grow, we are expanding our local service organisation.

Our Values

• Pursuit of Technical Leadership

• Open and Transparent Communication

• Accountability Built on Mutual Trust

• Commitment to Quality and Results

• Continuous Improvement Mindset

• Focus on Long-Term Partnerships

Requirements

Required Qualifications

  • MSc or PhD in Physics, Materials Science, Mechatronics, Electrical Engineering, Nanotechnology, or a related field.

  • 3 - 5+ years of experience in semiconductor equipment, metrology, or application engineering.

  • Experience in a customer-facing technical role such as Applications Engineering, Process Engineering, Field Applications, or Technical Support.

  • Experience developing, supporting, or applying metrology equipment in a semiconductor manufacturing environment.

  • Strong understanding of semiconductor fabrication and process control.

  • Strong communication and presentation skills with the ability to explain complex technical concepts clearly.

  • Experience with data analysis and visualisation using Python, MATLAB, or similar programming languages.

  • Fluent in English.

Preferred Qualifications

For senior-level candidates, we are particularly interested in:

  • Several years of experience within the semiconductor industry, preferably in metrology, characterization, or process control.

  • Hands-on experience with Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), or comparable nanoscale measurement techniques.

  • Experience working directly with semiconductor manufacturers, research institutes, or advanced technology development organizations.

  • Knowledge of advanced algorithms, data analytics, image processing, or machine learning applications in metrology.

  • Proven ability to independently lead customer-facing technical projects and application development activities.

Skills

Atomic Force Microscopy (AFM)Data AnalysisImage ProcessingMachine LearningMatlabMeasurement Recipe DevelopmentNanoscale MeasurementProcess ControlPythonScanning Probe Microscopy (SPM)Semiconductor Metrology

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