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Posted 21 days ago

Sr. Semiconductor Test EngineerMythic · Austin

Sr. Semiconductor Test Engineer

AustinHybrid

AI Summary

Owns end-to-end production test strategy for AI inference silicon, from bring-up and characterization through Wafer Sort, Final Package Test, and high-volume manufacturing, defining methodology, coverage, and release criteria.

About this role

Mythic builds AI inference processors based on analog compute-in-memory, an architecture that puts unusual demands on test: analog behavior, process variation, and trim and calibration all matter alongside conventional digital coverage. We are looking for a hands-on test engineer to own production test across the full silicon lifecycle, from bring-up and characterization through Wafer Sort, Final Package Test, and high-volume manufacturing.

This is not a maintenance role. This is a build role.

You will define how Mythic tests and ships silicon: the methodology, coverage strategy, screening philosophy, and release criteria, and the test programs and infrastructure that put them into practice. You will set strategy and also write code, debug hardware, and dig into manufacturing data yourself, working closely with design, DFT, product engineering, reliability, and manufacturing.

What you'll own

  • Mythic’s end-to-end production test strategy across Wafer Sort, Final Package Test, characterization, screening, and volume ramp
  • Test programs for new silicon products, from development and debug through production release and optimization
  • Test methodology, coverage strategy, screening philosophy, and release criteria
  • Silicon bring-up, characterization, correlation, guardbanding, and test transfer into manufacturing
  • Yield and quality analysis: finding systematic failures and escapes and driving them to root cause
  • Day-to-day technical work with OSATs, foundries, and ATE vendors to deploy and sustain test flows
  • Tradeoffs across test coverage, cost, test time, quality, and ramp schedule
  • Infrastructure, automation, and analytics for production test and yield learning
  • What you'll bring

    Required qualification
  • 5+ years in semiconductor test engineering, product engineering, or production test development
  • Hands-on ownership of Wafer Sort and Final Package Test
  • Developing, debugging, and releasing test programs on ATE platforms in production
  • Converting and translating test patterns from STIL, WGL, and VCD into ATE-specific pattern formats
  • Solid grounding in manufacturing test flows, device screening, test coverage, guardbanding, and outgoing quality
  • Experience taking silicon through bring-up, characterization, yield ramp, and production release
  • Strong debug skills and fluency with manufacturing test data
  • Experience working with design, DFT, product, reliability, and operations teams
  • Preferred qualifications
  • Testing mixed-signal or analog silicon, including trim and calibration
  • Experience with AI, accelerator, or high-performance compute silicon
  • Experience with Advantest, Teradyne, or similar ATE platforms
  • Probe cards, load boards, hardware interfaces, and test hardware debug
  • DFT structures such as scan, MBIST, and boundary scan
  • Managing OSATs and other external manufacturing partners
  • Scripting, automation, and test-data analysis (e.g., Python, JMP, or yield-analysis tools)
  • A track record of reducing test time and improving yield and correlation during ramp
  • What success looks like in your first year
  • Wafer Sort and Final Test flows are robust, scalable, and released to production
  • New products move from bring-up to manufacturing with strong coverage and few surprises
  • Yield issues are caught early and driven to root cause quickly
  • Test programs are stable, efficient, and built to scale with volume
  • Skills

    AdvantestATE PlatformsBoundary ScanDevice ScreeningDFTFinal Package TestGuardbandingJMPLoad BoardsMBISTMixed-signal TestingOSAT ManagementProbe CardsPythonScanSemiconductor Test EngineeringSTILTeradyneTest CoverageTrim And CalibrationVCDWafer SortWGLYield Analysis

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